Semiconductors are the foundation of modern-day technology, and improving their computing power is at the core of this dynamic industry. However, the mechanical performance also matters: adhesion of ...

The first step for semiconductor chips is visual inspection using an optical microscope or electrical measurements. 2 Mechanical probing, electron beams, emission microscopy, liquid crystal, etc., are ...

New platform for semiconductor inspection and metrology developed through joint research by Photo electron Soul and Nagoya University begins validation at KIOXIA Iwate NAGOYA, Japan — In late ...

Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

UC Santa Barbara researchers have achieved the first-ever “movie” of electric charges traveling across the interface of two different semiconductor materials. Using scanning ultrafast electron (SUEM) ...

A technical paper titled “Measuring electrical properties in semiconductor devices by pixelated STEM and off-axis electron holography (or convergent beams vs. plane waves).” was published by ...

Two premier institutes in the state of Himachal Pradesh, namely Himachal Pradesh University, Shimla, and IIT Mandi, have decided to ink an MOU on Electron Microscopy, Nanomaterials, and Semiconductor ...

Researchers from the University of California Santa Barbara have visualized photoexcited charges traveling across the interface of two different semiconductor materials within a solar cell. In a solar ...

A new type of semiconductor that can store information using electric fields may lead to more energy-efficient computers, ultra-precise sensors, and technologies that convert signals between ...